Investigation of Interfacial Magnetic Properties of Co/C60 Hybrid Interface

The present work demonstrates a detail investigation of interfacial magnetic properties

of cobalt (Co)/fullerene (C60) based ferromagnetic/organic (F/O) hybrid interface. The interfacial

structural properties of Co, C60 and hybrid interface have been analyzed by X-ray reflectivity

(XRR), both computationally and experimentally. The results shows that the grown films have

smooth surface (roughness < 0.5 nm) and intermixing at the interface between organic and

inorganic layers is less than 1 nm. The spin injection at the hybrid interface was studied by

recording the magnetic hysteresis loop at 100 K and photoemission of hybrid interface under the

applied bias and magnetic field. It has been observed that due to interfacial spin polarized

electron transfer at F/O interface, the photoemission of C60 reduces, coercivity of the cobalt

increases which give about 18% spin polarization of the carriers injected in C60. Finally, the

performance of C60 based tunnel junction have been studied in the device configuration viz.

Co/Al2O3/C60/Py. The magneto resistance (MR) of up to 10 % is obtained for device which

having C60 layer of thickness 10 nm.

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